Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

نویسندگان

  • Hiroaki Kawamoto
  • Seiji Miura
  • Kaori Yano
  • Kenji Ohkubo
  • Tetsuo Mohri
چکیده

Improvement of deformability for Mg-based composite materials with a dispersion of Ti particles has been considered in terms of the strain transfer through the interface, but is not fully understood during the deformation of ductile Ti particles. Mg-based composites composed of pure Mg and pure Ti plates was investigated to clarify the strain transfer through theMg/Ti interface using crystallographic orientation analysis based on electron back-scattered diffraction (EBSD) patterns. It is suggested that the larger Schmid factor and lower residual strain energy (W) are significant for the operation of a prismatic slip system in the Ti grains. [doi:10.2320/matertrans.MC200764]

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Crystallographic preferred orientations analysis of quartz crystals in Psammite using electron backscatter diffraction,western Ireland

The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

متن کامل

Microstructure Investigation on Metal Hydride Alloys by Electron Backscatter Diffraction Technique

The microstructures of two metal hydride (MH) alloys, a Zr7Ni10 based Ti15Zr26Ni59 and a C14 Laves phase based Ti12Zr21.5V10Ni36.2Cr4.5Mn13.6Sn0.3Co2.0Al0.4, were studied using the electron backscatter diffraction (EBSD) technique. The first alloy was found to be composed of completely aligned Zr7Ni10 grains with a ZrO2 secondary phase randomly scattered throughout and a C15 secondary phase pre...

متن کامل

Misorientation Mapping for Visualization of Plastic Strain via Electron Back-scattered Diffraction

The ability to map elastic or plastic strain on a microstructural level is critical to understanding and controlling deformation in structural alloys and ceramics. Electron back-scattered diffraction (EBSD) and related techniques, such as electron channeling patterns, have been used with some success to measure the plastic strain around cracks in Fe-3Si single crystals [1], Cu single crystals [...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008